| Modeling of APSIM-based simulation of leaf area index of wheat in dryland |
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| DOI：10.7606/j.issn.1000-7601.2013.04.018 |
| Key Words: APSIM wheat simulation leaf area index |
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| Abstract: |
| In order to understand the growth law of leaves of wheat in dryland, the APSIM-based model of leaf area potential growth and the leaf area growth model regarding to water and nitrogen stress were built. The parameters of APSIM were modified and verified according to the data collected from the field experiment, and the dynamic process of leaf area index (LAI) during the growth period of wheat was simulated by connecting the models to APSIM-Wheat. Furthermore, the change law of LAI of wheat was explored by using correlation analysis method. The results showed that the APSIM-based model of leaf area potential growth and the leaf area growth model regarding to water and nitrogen stress could be used to simulate the dynamic process of LAI of wheat with a high accuracy. During the whole growth period of wheat, the simulated and observed LAI values were positively correlated (R=0.996), with the normalized root mean square error (NRMSE) within 3.08%～9.38% and the effectiveness index (ME) within 0.594～0.956. |